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Agilent In-situ EC AFM / STM

Agilent In-situ Atomic Force Microscope and STM are of ideal design to acquire in-situ imaging while the sample is under liquid, at high low temperature, and under potential control in an electrochemistry cell.  Unique environmental chamber design allow atmosphere control for low oxygen environment.  

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In-situ Imaging Gallery

In-situ Kelvin Force Microscopy using lithography shows a "written" positive charge frame.

In-situ KFM imaging of charge dissipation.   In-situ Kelvin Force Microscopy shows a "written" positive charge frame surrounding a negative charge.

In-situ image of Cu EC platting

in-situ imaging of Cu electroplating inside a electrochemistry cell.

In-situ AFM image of dissolve of calcite

In-situ imaging of calcite dissolve in water

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